Charge Collection Efficiency Simulations of Irradiated Silicon Strip Detectors
T. Peltola

TL;DR
This study uses TCAD simulations to analyze charge collection efficiency in irradiated silicon strip detectors, comparing results with experimental data to understand radiation effects on detector performance.
Contribution
It introduces detailed TCAD simulation models for irradiated silicon strip detectors and validates them against experimental measurements.
Findings
Simulations agree well with experimental CCE measurements.
Radiation-induced defects significantly reduce charge collection efficiency.
Position dependency of CCE is accurately modeled and observed.
Abstract
During the scheduled high luminosity upgrade of LHC, the world's largest particle physics accelerator at CERN, the position sensitive silicon detectors installed in the vertex and tracking part of the CMS experiment will face more intense radiation environment than the present system was designed for. Thus, to upgrade the tracker to required performance level, comprehensive measurements and simulations studies have already been carried out. Essential information of the performance of an irradiated silicon detector is obtained by monitoring its charge collection efficiency (CCE). From the evolution of CCE with fluence, it is possible to directly observe the effect of the radiation induced defects to the ability of the detector to collect charge carriers generated by traversing minimum ionizing particles (mip). In this paper the numerically simulated CCE and CCE loss between the strips of…
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