Surface-to-bulk scattering in topological insulator films
Kush Saha, Ion Garate
TL;DR
This paper develops a microscopic theory for how disorder and phonons cause surface and bulk states to interact in topological insulator films, affecting their transport and photoemission properties.
Contribution
It introduces a simple structure for surface-to-bulk scattering matrix elements and analyzes their dependence on various physical parameters.
Findings
Bulk-surface coupling significantly influences transport and photoemission.
Surface-to-bulk scattering depends on temperature, carrier density, and film thickness.
The theory provides quantitative insights into disorder and phonon effects in TIs.
Abstract
We present a quantitative microscopic theory of the disorder- and phonon-induced coupling between surface and bulk states in topological insulator (TI) films. We find a simple structure for the surface-to-bulk scattering matrix elements and confirm the importance of bulk-surface coupling in transport and photoemission experiments, assessing its dependence on temperature, carrier density, film thickness and particle-hole asymmetry.
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Taxonomy
TopicsTopological Materials and Phenomena · Photorefractive and Nonlinear Optics · Algebraic structures and combinatorial models