Crystallization characteristics and chemical bonding properties of nickel carbide thin film nanocomposites
Andrej Furlan, Jun Lu, Lars Hultman, Ulf Jansson, Martin Magnuson

TL;DR
This study investigates the crystallization and chemical bonding in nickel carbide thin films, revealing phase transformations, nanostructure evolution, and their impact on electrical resistivity with varying carbon content.
Contribution
It provides detailed insights into phase structures, bonding properties, and nanostructure changes in nickel carbide thin films across different compositions, using multiple advanced characterization techniques.
Findings
Identification of hcp-NiC_y phase instead of Ni_3C.
Nanocrystalline grains of 10-20 nm size at low carbon content.
Resistivity increases significantly upon amorphization.
Abstract
The crystal structure and chemical bonding of magnetron-sputtering deposited nickel carbide NiC (0.05x0.62) thin films have been investigated by high-resolution X-ray diffraction, transmission electron microscopy, X-ray photoelectron spectroscopy, Raman spectroscopy, and soft X-ray absorption spectroscopy. By using X-ray as well as electron diffraction, we found carbon-containing hcp-Ni (hcp-NiC phase), instead of the expected rhombohedral-NiC. At low carbon content (4.9 at\%) the thin film consists of hcp-NiC nanocrystallites mixed with a smaller amount of fcc-NiC. The average grain size is about 10-20 nm. With the increase of carbon content to 16.3 at\%, the film contains single-phase hcp-NiC nanocrystallites with expanded lattice parameters. With further increase of carbon content to 38 at\%, and 62 at\%, the films transform to…
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