Fourier Transform Analysis of STM Images of Multilayer Graphene Moir\'e Patterns

TL;DR

This paper uses a simple model to analyze STM images of multilayer graphene moiré patterns, successfully reproducing Fourier transform features and highlighting interpretation challenges.

Contribution

It introduces a straightforward modeling approach that accurately captures complex Fourier features in STM images of multilayer graphene moiré patterns.

Findings

Model reproduces key FFT features of moiré patterns

Highlights difficulties in interpreting FFT features

Provides insights into multilayer graphene structures

Abstract

With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moir\'e patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.