In situ characterization of delamination and crack growth of a CGO-LSM multi-layer ceramic sample investigated by X-ray tomographic microscopy

TL;DR

This study uses in situ X-ray microtomography to analyze crack growth and delamination in a multilayer ceramic sample, revealing the influence of layer orientation and sintering on failure dynamics.

Contribution

It provides new insights into the real-time crack propagation and delamination mechanisms in multi-layer ceramics using advanced imaging techniques.

Findings

Crack growth is faster along material layers.

Defects are nucleated during debinding, not from initial preparation.

Sintering accelerates crack growth and delamination.

Abstract

The densification, delamination and crack growth behavior in a Ce$_{0.9}$Gd$_{0.1}$O$_{1.95}$ (CGO) and (La$_{0.85}$Sr$_{0.15})_{0.9}$MnO$_{3}$ (LSM) multi-layer ceramic sample was studied using in situ X-ray tomographic microscopy (microtomography), to investigate the critical dynamics of crack propagation and delamination in a multilayered sample. Naturally occurring defects, caused by the sample preparation process, are shown not to be critical in sample degradation. Instead defects are nucleated during the debinding step. Crack growth is significantly faster along the material layers than perpendicular to them, and crack growth and delamination only accelerates when sintering occurs.