On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations

TL;DR

This paper investigates delay faults in FPGA I/O blocks caused by ionizing radiation, demonstrating experimental methods to characterize such faults and reporting delays up to 6.2ns triggered by radiation-induced bit flips.

Contribution

It introduces experimental techniques to characterize delay faults in FPGA I/O blocks due to radiation, providing new insights into fault mechanisms and their impact.

Findings

Delay faults up to 6.2ns caused by ionizing radiation.

Experimental methods for fault characterization.

Delay faults triggered by radiation-induced bit flips.

Abstract

Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported.