Cross-spectrum Analyzer for Low Frequency Noise Analysis
Xing Zhong, Sahar Keshavarz, Josh Jones, Claudia Mewes, Patrick R., LeClair

TL;DR
This paper presents a cost-effective, PC-based cross-spectrum analyzer capable of measuring ultra-low frequency noise with high accuracy, suitable for low-level noise research across various resistors.
Contribution
It introduces a novel software-driven system for low frequency noise analysis using common hardware, achieving high sensitivity comparable to expensive solutions.
Findings
Accurately measures voltage noise as low as 10^{-19} V^2/Hz from 0.001 Hz to 100 kHz.
Characterizes noise spectra of resistors, revealing a 1/f dependence.
Optimizes measurement sensitivity by balancing averaging time and accuracy.
Abstract
The design and performance of a sensitive and reliable cross-correlation spectrum analyzer for studying low frequency transport noise is described in detail. The design makes use of common PC-based data acquisition hardware and preamplifiers to acquire time-based data, along with software we have developed to compute the cross-correlation and noise spectral density. The impedance of device under test may cover four decades from to . By utilizing a custom developed signal processing program, this system is tested to be accurate and efficient for measuring voltage noise as low as from Hz to kHz within one day's averaging time, comparable with more expensive hardware solutions (bandwidth in real measurements may be limited by the sample impedance and stray capacitance). The time…
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Taxonomy
TopicsForce Microscopy Techniques and Applications · Integrated Circuits and Semiconductor Failure Analysis · Advanced Memory and Neural Computing
