Evaluation of Constant Potential Method in Simulating Electric Double-Layer Capacitors
Zhenxing Wang, Yang Yang, David L. Olmsted, Mark Asta, Brian B., Laird

TL;DR
This study compares the fixed charge and constant potential methods in molecular simulations of electric double-layer capacitors, showing that the latter provides more realistic ion behavior at higher voltages by allowing electrode charge fluctuations.
Contribution
It demonstrates the importance of using the constant potential method over the fixed charge method for accurate simulation of EDLCs at high voltages.
Findings
At low potential differences, both methods produce similar ion and solvent profiles.
At high voltages, the constant potential method shows increased Li+ near the electrode surface.
The constant potential method reduces energy barriers for ion approach, improving simulation realism.
Abstract
A major challenge in the molecular simulation of electric double layer capacitors (EDLCs) is the choice of an appropriate model for the electrode. Typically, in such simulations the electrode surface is modeled using a uniform fixed charge on each of the electrode atoms, which ignores the electrode response to local charge fluctuations induced by charge fluctuations in the electrolyte. In this work, we evaluate and compare this Fixed Charge Method (FCM) with the more realistic Constant Potential Method (CPM), [Reed, et al., J. Chem. Phys., 126, 084704 (2007)], in which the electrode charges fluctuate in order to maintain constant electric potential in each electrode. For this comparison, we utilize a simplified LiClO-acetonitrile/graphite EDLC. At low potential difference (), the two methods yield essentially identical results for ion and solvent density profiles;…
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