Application of algorithms for high precision metrology

TL;DR

This paper evaluates and compares algorithms for processing laser beam measurements in high-precision metrology, focusing on the Gaia Basic Angle Monitoring system, and verifies their micro-arcsecond level performance through simulations.

Contribution

It introduces and assesses various algorithms, from simple to model-based, for high-precision laser metrology signal processing in space applications.

Findings

Algorithms achieve micro-arcsecond accuracy in simulations.

Model-based approaches outperform simple methods under perturbations.

Performance verified across noiseless and noisy conditions.

Abstract

This paper evaluates the performance of algorithms suitable to process the measurements from two laser beam metrology systems, in particular with reference to the Gaia Basic Angle Monitoring device. The system and signal characteristics are reviewed in order to define the key operating features. The low-level algorithms are defined according to different approaches, starting with a simple, model free method, and progressing to a strategy based on the signal template and variance. The signal model is derived from measured data sets. The performance at micro-arcsec level is verified by simulation in conditions ranging from noiseless to large perturbations.