Effect of strain on electronic and thermoelectric properties of few layers to bulk MoS$_{2}$
Swastibrata Bhattacharyya, Tribhuwan Pandey, Abhishek K. Singh

TL;DR
This study uses first principles calculations to show how different strains can tune the electronic and thermoelectric properties of MoS₂, inducing a reversible semiconductor-metal transition and optimizing thermoelectric performance.
Contribution
It reveals how normal compressive, biaxial compressive, and biaxial tensile strains affect the band gap and transport properties of MoS₂, providing insights for straintronics applications.
Findings
Reversible semiconductor-metal transition under all strain types.
Optimal thermoelectric performance in 2L and 3L MoS₂ under specific strains.
Large thermopower comparable to top thermoelectric materials.
Abstract
The sensitive dependence of electronic and thermoelectric properties of MoS on the applied strain opens up a variety of applications in the emerging area of straintronics. Using first principles based density functional theory calculations, we show that the band gap of few layers of MoS can be tuned by applying i) normal compressive (NC), ii) biaxial compressive (BC), and iii) biaxial tensile (BT) strain. A reversible semiconductor to metal transition (S-M transition) is observed under all three types of strain. In the case of NC strain, the threshold strain at which S-M transition occurs increases with increasing number of layers and becomes maximum for the bulk. On the other hand, the threshold strain for S-M transition in both BC and BT strain decreases with the increase in number of layers. The difference in the mechanisms for the S-M transition is explained for different…
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