Temperature dependence of the spin relaxation in highly degenerate ZnO thin films
M. C. Prestgard, G. Siegel, R. Roundy, M. Raikh, and A. Tiwari

TL;DR
This study investigates how temperature affects spin relaxation in highly degenerate ZnO thin films, revealing that the Dyakonov-Perel mechanism, modified for wurtzite structure, dominates the relaxation process.
Contribution
It provides a detailed analysis of spin relaxation mechanisms in highly doped ZnO films using temperature-dependent Hanle measurements, highlighting the modified Dyakonov-Perel process.
Findings
Spin relaxation time varies with temperature.
Dyakonov-Perel mechanism is dominant.
Modified for wurtzite structure, spin relaxation rate is linear-in-momentum.
Abstract
Zinc oxide is a wide-bandgap semiconductor which is considered a potential candidate for fabricating next-generation transparent spintronic devices. However, before this can be practically achieved, a thorough, scientific understanding of the various spin transport and relaxation processes undergone in this material is essential. In the present paper we report our investigations into these processes via temperature dependent, non-local Hanle experiments. Epitaxial ZnO thin films were deposited on c-axis sapphire substrates using a pulsed laser deposition technique. Careful structural, optical, and electrical characterizations of the films were performed. Temperature dependent Hanle measurements were carried out, using an all-electrical scheme for spin injection and detection, in a non-local geometry over the temperature range of 20 - 300 K. Carrier concentration in these films, as…
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