Measuring Galaxy Clustering and the Evolution of [CII] Mean Intensity with far-IR Line Intensity Mapping During 0.5 < z < 1.5
Bade D. Uzgil, James E. Aguirre, Charles M. Bradford, and Adam Lidz

TL;DR
This paper investigates using 3-D intensity mapping of far-IR line emissions, especially [CII], to study galaxy clustering and evolution from redshift 0.5 to 1.5, highlighting its advantages over traditional galaxy surveys.
Contribution
It demonstrates the effectiveness of intensity mapping for measuring total line emission and galaxy clustering, especially in the 0.5<z<1.5 range, and compares it to blind galaxy surveys.
Findings
Intensity mapping efficiently measures total line emission.
It outperforms blind galaxy surveys in depth and coverage.
Optimal for studying galaxy evolution during 0.5<z<1.5.
Abstract
Infrared fine-structure emission lines from trace metals are powerful diagnostics of the interstellar medium in galaxies. We explore the possibility of studying the redshifted far-IR fine-structure line emission using the three-dimensional (3-D) power spectra obtained with an imaging spectrometer. The intensity mapping approach measures the spatio-spectral fluctuations due to line emission from all galaxies, including those below the individual detection threshold. The technique provides 3-D measurements of galaxy clustering and moments of the galaxy luminosity function. Furthermore, the linear portion of the power spectrum can be used to measure the total line emission intensity including all sources through cosmic time with redshift information naturally encoded. Total line emission, when compared to the total star formation activity and/or other line intensities reveals evolution of…
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