All-Optical Blister Test of Suspended Graphene Using Micro-Raman Spectroscopy
Dominik Metten, Fran\c{c}ois Federspiel, Michelangelo Romeo, and, St\'ephane Berciaud

TL;DR
This study uses micro-Raman spectroscopy to non-invasively measure the mechanical properties of suspended graphene membranes under pressure, enabling precise determination of Young's modulus and strain effects.
Contribution
It introduces an all-optical, contactless method to analyze the mechanical response of graphene membranes, validating theoretical pressure scaling and measuring Grüneisen parameters.
Findings
Young's modulus of graphene measured as 1.05 TPa
Blister height scales with pressure to the one-third power
Grüneisen parameters for G and 2D modes determined
Abstract
We report a comprehensive micro-Raman study of a pressurized suspended graphene membrane that hermetically seals a circular pit, etched in a Si/SiO substrate. Placing the sample under a uniform pressure load results in bulging of the graphene membrane and subsequent softening of the main Raman features, due to tensile strain. In such a microcavity, the intensity of the Raman features depends very sensitively on the distance between the graphene membrane and the Si substrate, which acts as the bottom mirror of the cavity. Thus, a spatially resolved analysis of the intensity of the G- and 2D-mode features as a function of the pressure load permits a direct reconstruction of the blister profile. An average strain is then deduced at each pressure load, and Gr\"{u}neisen parameters of and are determined for the Raman G and 2D modes, respectively. In addition, the…
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