Inelastic X-ray scattering from valence electrons near absorption edges of FeTe and TiSe$_2$
B. Barbiellini, J. N. Hancock, C. Monney, Y. Joly, G. Ghiringhelli, L., Braicovich, T. Schmitt

TL;DR
This paper investigates resonant inelastic x-ray scattering (RIXS) in metallic FeTe and semi-metallic TiSe$_2$, demonstrating a theoretical approach to extract dynamical structure factors using effective dielectric functions near absorption edges.
Contribution
It introduces a renormalization group theory framework to describe RIXS cross sections in metallic systems, linking core electron effects to atomic scattering parameters.
Findings
RIXS peaks correspond to low energy particle-hole excitations.
Theoretical model accurately describes RIXS amplitudes.
Method enables extraction of dynamical structure factors from experimental spectra.
Abstract
We study resonant inelastic x-ray scattering (RIXS) peaks corresponding to low energy particle-hole excited states of metallic FeTe and semi-metallic TiSe for photon incident energy tuned near the absorption edge of Fe and Ti respectively. We show that the cross section amplitudes are well described within a renormalization group theory where the effect of the core electrons is captured by effective dielectric functions expressed in terms of the the atomic scattering parameters of Fe and Ti. This method can be used to extract the dynamical structure factor from experimental RIXS spectra in metallic systems.
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