A framework for improving the performance of verification algorithms with a low false positive rate requirement and limited training data
Ognjen Arandjelovic

TL;DR
This paper introduces a statistical, model-based framework for setting distance thresholds in verification tasks with low false positive rate requirements, especially when training data is limited, demonstrated on face verification.
Contribution
It proposes a novel analysis-by-synthesis iterative algorithm that estimates class-specific parameters for threshold setting based on a normal distribution model of pattern distances.
Findings
Effective threshold estimation for low FPR in verification
Applicable to face verification with limited training data
Model-based approach outperforms traditional methods
Abstract
In this paper we address the problem of matching patterns in the so-called verification setting in which a novel, query pattern is verified against a single training pattern: the decision sought is whether the two match (i.e. belong to the same class) or not. Unlike previous work which has universally focused on the development of more discriminative distance functions between patterns, here we consider the equally important and pervasive task of selecting a distance threshold which fits a particular operational requirement - specifically, the target false positive rate (FPR). First, we argue on theoretical grounds that a data-driven approach is inherently ill-conditioned when the desired FPR is low, because by the very nature of the challenge only a small portion of training data affects or is affected by the desired threshold. This leads us to propose a general, statistical…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdversarial Robustness in Machine Learning · Algorithms and Data Compression · VLSI and Analog Circuit Testing
