Demonstration of new possibilities of multilayer technology on resistive microstrip/ microdot detectors

TL;DR

This paper demonstrates how adding internal field shaping strips in resistive microstrip and microdot detectors can optimize electric fields, opening new possibilities for detector performance enhancement.

Contribution

It introduces a novel method of internal field shaping in resistive microstrip and microdot detectors, which was not previously explored.

Findings

Successful optimization of electric fields using internal shaping strips

Enhanced detector performance potential demonstrated

First practical implementation of internal field shaping in these detectors

Abstract

The first successful attempts to optimize the electric field in Resistive Microstrip Gas Chamber and resistive microdot detectors using additional field shaping strips located inside the detector substrate are described