A simple and robust method to study after-pulses in Silicon Photomultipliers

TL;DR

This paper introduces a straightforward, statistically robust method to measure after-pulsing probability and time constants in Silicon Photomultipliers, demonstrated on a HAMAMATSU MPPC device.

Contribution

The paper presents a new simple and robust measurement technique for after-pulsing in Silicon Photomultipliers, utilizing the Central Limit Theorem for statistical reliability.

Findings

Effective measurement of after-pulsing probability and time constant

Method validated on HAMAMATSU MPPC S10362-11-100C

Simplifies and improves robustness of after-pulse analysis

Abstract

The after-pulsing probability in Silicon Photomulti- pliers and its time constant are obtained measuring the mean number of photo-electrons in a variable time window following a light pulse. The method, experimentally simple and statistically robust due to the use of the Central Limit Theorem, has been applied to an HAMAMATSU MPPC S10362-11-100C.