Depth Map Prediction from a Single Image using a Multi-Scale Deep Network
David Eigen, Christian Puhrsch, Rob Fergus

TL;DR
This paper introduces a multi-scale deep learning approach for predicting depth from a single image, combining global and local information to improve accuracy and handle scale ambiguity, achieving state-of-the-art results.
Contribution
The novel multi-scale deep network architecture effectively integrates global and local cues for single-image depth prediction, addressing scale ambiguity and improving boundary accuracy.
Findings
Achieves state-of-the-art results on NYU Depth and KITTI datasets.
Effectively models depth relations using scale-invariant error.
Refines depth predictions locally for detailed boundaries.
Abstract
Predicting depth is an essential component in understanding the 3D geometry of a scene. While for stereo images local correspondence suffices for estimation, finding depth relations from a single image is less straightforward, requiring integration of both global and local information from various cues. Moreover, the task is inherently ambiguous, with a large source of uncertainty coming from the overall scale. In this paper, we present a new method that addresses this task by employing two deep network stacks: one that makes a coarse global prediction based on the entire image, and another that refines this prediction locally. We also apply a scale-invariant error to help measure depth relations rather than scale. By leveraging the raw datasets as large sources of training data, our method achieves state-of-the-art results on both NYU Depth and KITTI, and matches detailed depth…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Vision and Imaging · Robotics and Sensor-Based Localization · Optical measurement and interference techniques
