Fast Ultrahigh-Density Writing of Low Conductivity Patterns on Semiconducting Polymers

TL;DR

This paper demonstrates a rapid method for patterning low conductivity regions on semiconducting polymers using AFM tip interactions, achieving high speed and nanoscale resolution without surface topography changes.

Contribution

It introduces a novel AFM-based technique that locally alters molecular disorder to create conductivity patterns at unprecedented speeds.

Findings

Patterning speed exceeds 20 μm/s

Resolution is approximately 20 nm

No detectable surface topography modifications

Abstract

The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most of them rely on Atomic Force Microscopy to thermally or electrostatically induce mass transport, thereby creating topographic features. Here we show that the mechanical interaction of the tip of the Atomic Force Microscope with the surface of a class of conjugate polymers produces a local increase of molecular disorder, inducing a localized lowering of the semiconductor conductivity, not associated to detectable modifications in the surface topography. This phenomenon allows for the swift production of low conductivity patterns on the polymer surface at an unprecedented speed exceeding 20 $\mu m s^{-1}$; paths have a resolution in the order of the tip size (20 nm) and are detected by a Conducting-Atomic Force Microscopy tip in the conductivity maps.