Radiation Hardness of High-Q Silicon Nitride Microresonators for Space Compatible Integrated Optics
Victor Brasch, Qun-Feng Chen, Stephan Schiller, Tobias J. Kippenberg

TL;DR
This study demonstrates that high-Q silicon nitride microresonators used in integrated optics are resistant to proton radiation, making them suitable for space applications where radiation exposure is a concern.
Contribution
It provides the first assessment of proton radiation effects on silicon nitride microresonators, showing their robustness for space-compatible integrated optical devices.
Findings
Proton irradiation does not increase optical losses in silicon nitride microresonators.
Silicon nitride microresonators maintain high quality factors after radiation exposure.
The results support their use in space-based optical systems.
Abstract
Integrated optics has distinct advantages for applications in space because it integrates many elements onto a monolithic, robust chip. As the development of different building blocks for integrated optics advances, it is of interest to answer the important question of their resistance with respect to ionizing radiation. Here we investigate effects of proton radiation on high-Q silicon nitride microresonators formed by a waveguide ring. We show that the irradiation with high-energy protons has no lasting effect on the linear optical losses of the microresonators.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
