High Pressure Structural Stability, and Optical Properties of Scheelite type ZrGeO$_4$ and HfGeO$_4$ X-ray Phosphor Hosts
G. Shwetha, V. Kanchana, K. Ramesh Babu, G. Vaitheeswaran, M. C., Valsakumar

TL;DR
This study uses ab-initio calculations to explore the high-pressure stability, elastic, electronic, and optical properties of ZrGeO4 and HfGeO4, revealing their potential as x-ray phosphor hosts and effects of Ti doping.
Contribution
It provides a comprehensive first-principles analysis of structural, electronic, and optical properties of ZrGeO4 and HfGeO4, including effects of Ti doping, which was not previously detailed.
Findings
ZrGeO4 and HfGeO4 are insulators with band gaps of 5.39 eV and 6.25 eV.
The compounds exhibit anisotropic compressibility and optical properties.
Ti doping reduces the band gap, enabling visible light emission.
Abstract
\emph{Ab-initio} calculations were performed on the scheelite type MGeO (M = Hf, and Zr) compounds which find wide range of applications such as in x-ray imaging. We have studied the high pressure structural stability, elastic constants, electronic structure and optical properties of these compounds through density functional theory calculations. Two different density functional approaches namely plane wave pseudopotential method (PW-PP) and full potential linearized augmented plane wave method (FP-LAPW) were used for the present study. The ground state structural and vibrational properties are calculated and found to be in good agreement with experimental data. The compressibility of Zr and Hf germanates is found to be anisotropic as the a-axis is less compressible over c-axis due to the presence of Ge-O bonds along a-axis which is further confirmed from the ordering of the elastic…
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Taxonomy
TopicsLuminescence Properties of Advanced Materials · High-pressure geophysics and materials · Crystal Structures and Properties
