Neutral particle Mass Spectrometry with Nanomechanical Systems

TL;DR

This paper demonstrates that nanomechanical systems-based mass spectrometry can analyze neutral particles and is insensitive to charge states, offering clearer spectra and new possibilities for analyzing non-ionizable analytes.

Contribution

The study introduces NEMS-MS as a charge-insensitive mass spectrometry technique capable of analyzing neutral particles, expanding MS applications beyond ionizable species.

Findings

NEMS-MS produces a single peak regardless of charge state.

NEMS-MS can measure neutral particles after charge removal.

NEMS-MS offers clearer spectra compared to traditional TOF-MS.

Abstract

Current approaches to Mass Spectrometry (MS) require ionization of the analytes of interest. For high-mass species, the resulting charge state distribution can be complex and difficult to interpret correctly. In this article, using a setup comprising both conventional time-of-flight MS (TOF-MS) and Nano-Electro-Mechanical-Systems-based MS (NEMS-MS) in situ, we show directly that NEMS-MS analysis is insensitive to charge state: the spectrum consists of a single peak whatever the species charge state, making it significantly clearer than existing MS analysis. In subsequent tests, all charged particles are electrostatically removed from the beam, and unlike TOF-MS, NEMS-MS can still measure masses. This demonstrates the possibility to measure mass spectra for neutral particles. Thus, it is possible to envisage MS-based studies of analytes that are incompatible with current ionization techniques and the way is now open for the development of cutting edge system architectures with unique analytical capability.