A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements

TL;DR

This paper introduces a numerical method to accurately determine the optical and geometrical properties of three-layer waveguides using m-lines spectroscopy, validated through simulations and experiments.

Contribution

A novel numerical approach for simultaneous measurement of refractive index and thickness in three-layer waveguides using m-lines spectroscopy.

Findings

Method accurately retrieves layer properties from noisy data

Numerical simulations confirm high precision of the approach

Experimental validation with PZT and ZnO layers demonstrates practical applicability

Abstract

We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers.