Single-shot MeV transmission electron microscopy with picosecond temporal resolution
R. K. Li, P. Musumeci

TL;DR
This paper explores using a relativistic radiofrequency photoinjector to develop a single-shot MeV transmission electron microscope capable of achieving 10 nanometer spatial and 10 picosecond temporal resolution, advancing time-resolved imaging.
Contribution
It introduces a novel approach employing a relativistic electron source for high-resolution, time-resolved TEM, supported by detailed modeling and optimization.
Findings
Feasibility of 10 nm spatial resolution
Achieving 10 ps temporal resolution
Potential for single-shot imaging
Abstract
Pushing the limits in temporal resolution for transmission electron microscopy (TEM) requires a revolutionary change in the electron source technology. In this paper we study the possibility of employing a radiofrequency photoinjector as the electron source for a time-resolved TEM. By raising the beam energy to the relativistic regime we minimize the space charge effects which otherwise limit the spatio-temporal resolution of the instrument. Analysis and optimization of the system taking into account the achievable beam brightness, electron flux on the sample, chromatic and spherical aberration of the electron optic system, and space charge effects in image formation are presented and supported by detailed numerical modeling. The results demonstrate the feasibility of 10 nanometer - 10 picosecond spatio-temporal resolution single-shot MeV TEM.
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Fluorescence Microscopy Techniques
