Space environments variability and its impact on total dose and single event effects in electronic parts

TL;DR

This paper models how space radiation variability affects total dose and single event effects in electronics, revealing non-linear impacts on error rates during solar flares and the influence of thermal annealing.

Contribution

It introduces a novel simulation approach to assess space radiation effects considering variability and thermal annealing impacts on electronic parts.

Findings

Thermal annealing causes non-stationary relaxation after dose-rate peaks.

Soft error rates increase significantly during solar flares, mitigated by scrubbing.

Non-linear dependence of error rates on particle flux was observed.

Abstract

The aim of this paper is the modeling and simulation of impact of space radiation variability on total dose and single event effects in spaceborne electronics. It has been shown that the simultaneous thermal annealing may lead to non-stationary relaxation after dose-rate peaks. Significant enhancement of soft error rate during solar flares in the memories mitigated by the scrubbing due to non-linear dependence on particle flux has been revealed.