Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

TL;DR

This paper demonstrates the use of high-resolution X-PEEM to image and analyze conducting ferroelectric domain walls in ErMnO3, revealing their electronic conductance and chemical structure with high spatial resolution.

Contribution

It extends X-PEEM application to visualize and characterize ferroelectric domain walls based on photo-induced effects, enabling non-destructive, element-specific studies.

Findings

Domain walls visualized via photo-induced charging effects

Local electronic conductance mapped through photoelectron energy distribution

Method applicable for non-destructive analysis of ferroelectric domain structures

Abstract

High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.