Near-wall nanovelocimetry based on Total Internal Reflection Fluorescence with continuous tracking
Zhenzhen Li, Lo\"ic D'eramo, Choongyeop Lee, Fabrice Monti, Marc, Yonger, Benjamin Chollet, Bruno Bresson, Yvette Tran, Patrick Tabeling

TL;DR
This paper introduces a novel TIRF-based nanovelocimetry technique that continuously tracks nanoparticles near walls, achieving high accuracy in measuring slip lengths and flow structures at nanometric resolution.
Contribution
It presents a continuous tracking method for near-wall velocimetry using TIRF, reducing biases and improving measurement accuracy over existing techniques.
Findings
Measured slip lengths with reduced errors on different surfaces.
Demonstrated capacity to accurately quantify near-wall flow properties.
Confirmed discrepancies between numerical and experimental slip length estimates.
Abstract
The goal of this work is to make progress in the domain of near-wall velocimetry. The technique we use is based on the tracking of nanoparticles in an evanescent field, close to a wall, a technique called TIRF (Total Internal Reflection Fluorescence)-based velocimetry. At variance with the methods developed in the literature, we permanently keep track of the light emitted by each particle during the time the measurements of their positions ('altitudes') and speeds are performed. By performing the Langevin simulation, we quantified effect of biases such as Brownian motion, heterogeneities induced by the walls, statistical biases, photo bleaching, polydispersivity and limited depth of field. Using this method, we obtained slip length on hydrophilic surfaces of 15 nm for sucrose solution, and 910 nm for water; On hydrophobic surface, 325 nm for sucrose solution, and…
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