Main Magnetic Focus Ion Trap, new tool for trapping of highly charged ions
V. P. Ovsyannikov

TL;DR
This paper introduces a new magnetic focus ion trap that uses a rippling electron beam to trap highly charged ions, demonstrating the production of iridium ions with charges up to 50+ and high electron current densities.
Contribution
It presents a novel magnetic focus ion trap design utilizing a rippling electron beam for efficient trapping of highly charged ions, with experimental validation.
Findings
Iridium ions with charges up to 50+ were produced.
Electron current density in the trap can reach approximately 10 kA/cm^2.
Device prototypes operate with electron beam energies between 3-10 keV.
Abstract
It is proposed to produce the highly charged ions in the local ion trap formed by a rippling electron beam in the focusing magnetic field. The experimental results demonstrate the presence of iridium ions with charges up to 50+. According to estimates, the average electron current density in the local ion trap can reach the value of the order of 10 kA/cm^2. The pilot examples of devices of this type with the electron beam energies within the range 3-10 keV are also presented.
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Taxonomy
TopicsMass Spectrometry Techniques and Applications
