Extremely high-resolution measurements of microwave magnetisation dynamics in magnetic thin films and nanostructures

TL;DR

This paper introduces an interferometric measurement technique that enables extremely high-resolution analysis of microwave magnetization dynamics in magnetic thin films and nanostructures, surpassing traditional broadband methods.

Contribution

The work presents a novel interferometric approach for studying microwave magnetization dynamics with unprecedented resolution in ferromagnetic nanostructures.

Findings

Resolved features impossible with broadband ferromagnetic resonance

Demonstrated high-resolution measurement capability

Enhanced understanding of magnetization dynamics at nanoscale

Abstract

In this work we discuss the use of interferometric measurement technique to study microwave magnetization dynamics on ferromagnetic nanostructures. We demonstrate that in this way one can resolve features which are impossible to resolve with broadband ferromagnetic resonance and traveling spin wave spectroscopy otherwise.