On the Design of LIL Tests for (Pseudo) Random Generators and Some Experimental Results
Yongge Wang

TL;DR
This paper introduces new statistical testing techniques, including LIL-based tests, to improve the detection of deviations from true randomness in pseudorandom generators, addressing limitations of the NIST SP800-22 suite.
Contribution
It proposes novel LIL-based and statistical distance testing methods to enhance randomness testing and reduces Type II errors in existing NIST tests.
Findings
LIL-based tests effectively detect non-randomness in pseudorandom sequences.
Experimental results show low statistical distance (~0.07) from uniform distribution.
Generated 30TB of sequences to validate testing techniques.
Abstract
NIST SP800-22 (2010) proposes the state of art testing suite for (pseudo) random generators to detect deviations of a binary sequence from randomness. On the one hand, as a counter example to NIST SP800-22 test suite, it is easy to construct functions that are considered as GOOD pseudorandom generators by NIST SP800-22 test suite though the output of these functions are easily distinguishable from the uniform distribution. Thus these functions are not pseudorandom generators by definition. On the other hand, NIST SP800-22 does not cover some of the important laws for randomness. Two fundamental limit theorems about random binary strings are the central limit theorem and the law of the iterated logarithm (LIL). Several frequency related tests in NIST SP800-22 cover the central limit theorem while no NIST SP800-22 test covers LIL. This paper proposes techniques to address the above…
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Taxonomy
TopicsChaos-based Image/Signal Encryption · Algorithms and Data Compression · Cellular Automata and Applications
