Nanoscale resolution scanning thermal microscopy with thermally conductive nanowire probes
Maria Timofeeva, Alexey Bolshakov, Peter D. Tovee, Dagou A. Zeze,, Vladimir G. Dubrovskii, Oleg V. Kolosov

TL;DR
This paper introduces an analytical model and experimental validation for nanoscale resolution scanning thermal microscopy using thermally conductive nanowire probes, addressing limitations in measuring high thermal conductivity materials.
Contribution
The work develops a new analytical model supported by simulations and experiments that enhances SThM performance with nanowire probes, overcoming previous limitations.
Findings
High thermal conductivity nanowire probes improve measurement accuracy.
Contact resistance significantly affects thermal measurements.
Experimental results with CNT probes validate the model.
Abstract
Scanning thermal microscopy (SThM) - a type of scanning probe microscopy that allows mapping thermal transport and temperatures in nanoscale devices, is becoming a key approach that may help to resolve heat dissipation problems in modern processors and develop new thermoelectric materials. Unfortunately, performance of current SThM implementations in measurement of high thermal conductivity materials continues to me limited. The reason for these limitations is two-fold - first, SThM measurements of high thermal conductivity materials need adequate high thermal conductivity of the probe apex, and secondly, the quality of thermal contact between the probe and the sample becomes strongly affected by the nanoscale surface corrugations of the studied sample. In this paper we develop analytical models of the SThM approach that can tackle these complex problems - by exploring high thermal…
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Taxonomy
TopicsThermal properties of materials · Advanced Thermoelectric Materials and Devices · Force Microscopy Techniques and Applications
