Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector

TL;DR

This paper introduces a novel microscope mode SIMS imaging technique using a Timepix detector, enabling high-sensitivity, parallel detection of ions for detailed surface analysis.

Contribution

It is the first integration of a Timepix detector with a Secondary Ion Mass Spectrometer for microscope mode imaging, enhancing detection capabilities.

Findings

Demonstrated high-resolution imaging of benchmark samples

Achieved improved signal-to-noise ratio

Successfully imaged biomolecules from tissue sections

Abstract

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a Secondary Ion Mass Spectrometer for microscope mode SIMS imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.