Cluster SIMS Microscope Mode Mass Spectrometry Imaging

TL;DR

This paper demonstrates the integration of a C60 primary ion source with a pixelated Timepix detector in a microscope mode secondary ion mass spectrometry imaging system, achieving high spatial resolution, improved sensitivity, and faster analysis of complex surfaces.

Contribution

It introduces a novel combination of C60 ion source and high-voltage pixelated detector for enhanced microscope mode SIM imaging, surpassing previous systems in resolution and speed.

Findings

High secondary ion yield with C60 source improves sensitivity.

Enhanced signal-to-noise ratio at high spatial resolution.

Faster analysis times compared to existing microscope mode systems.

Abstract

Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high speed imaging of biomolecules from complex surfaces. Technological developments such as new position-sensitive detectors, in combination with polyatomic primary ion sources, are required to exploit the full potential of microscope mode mass spectrometry imaging, i.e. to efficiently push the limits of ultra-high spatial resolution, sample throughput and sensitivity. In this work, a C60 primary source is combined with a commercial mass microscope for microscope mode secondary ion mass spectrometry imaging. The detector setup is a pixelated detector from the Medipix/Timepix family with high-voltage post-acceleration capabilities. The mass spectral and imaging performance of the system is tested with various benchmark samples and thin tissue sections. We show that the high secondary ion yield (with respect to traditional monatomic primary ion sources) of the C60 primary ion source and the increased sensitivity of the high voltage detector setup improve microscope mode secondary ion mass spectrometry imaging. The analysis time and the signal-to-noise ratio are improved compared to other microscope mode imaging systems, all at high spatial resolution. We have demonstrated the unique capabilities of a C60 ion microscope with a Timepix detector for high spatial resolution microscope mode secondary ion mass spectrometry imaging.