The EDMR Microscope - Combining Conductive Atomic Force Microscopy with Electrically Detected Magnetic Resonance

TL;DR

This paper introduces a novel combined microscope integrating EDMR with conductive AFM, enabling high-sensitivity, spatially-resolved magnetic resonance measurements at room temperature.

Contribution

The work presents the first integration of EDMR with (p)cAFM using a specialized microwave resonator and infrared optical readout, enhancing spatial and spin sensitivity in magnetic resonance imaging.

Findings

Detects resonant current changes as low as 20 fA

Achieves a spin sensitivity of 8×10^6 spins/Hz^0.5 at room temperature

Demonstrates spatial EDMR contrast in amorphous silicon samples

Abstract

We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8*10^6 spins/Hz^0.5 at room temperature.