Measurements of Charge Transfer Efficiency in a Proton-irradiated Swept Charge Device

TL;DR

This paper presents measurements of charge transfer efficiency in a proton-irradiated Swept Charge Device, developed for X-ray astronomy, demonstrating its performance and radiation resilience for space applications.

Contribution

It introduces a test method for measuring charge transfer efficiency in a proton-irradiated SCD, advancing understanding of its radiation tolerance.

Findings

Proton irradiation affects charge transfer inefficiency.

The SCD maintains high energy resolution after irradiation.

The test method effectively evaluates radiation damage.

Abstract

Charge Coupled Devices (CCDs) have been successfully used in several low energy X-ray astronomical satellite over the past two decades. Their high energy resolution and high spatial resolution make them an perfect tool for low energy astronomy, such as formation of galaxy clusters and environment of black holes. The Low Energy X-ray Telescope (LE) group is developing Swept Charge Device (SCD) for the Hard X-ray Modulation Telescope (HXMT) satellite. SCD is a special low energy X-ray CCD, which could be read out a thousand times faster than traditional CCDs, simultaneously keeping excellent energy resolution. A test method for measuring the charge transfer efficiency (CTE) of a prototype SCD has been set up. Studies of the charge transfer inefficiency (CTI) have been performed at a temperature range of operation, with a proton-irradiated SCD.