Critical exponent of metal-insulator transition in doped semiconductors: the relevance of the Coulomb interaction
Yosuke Harashima, Keith Slevin

TL;DR
This paper presents a simulation study of the metal-insulator transition in doped semiconductors, highlighting how Coulomb interactions influence the critical behavior and universality class of the transition.
Contribution
It introduces a density functional theory-based model that incorporates both disorder and Coulomb interactions, revealing a different critical exponent from traditional Anderson models.
Findings
Critical exponent ν ≈ 1.3 for the transition
Coulomb interactions alter the universality class
Differences from Anderson localization model
Abstract
We report a simulation of the metal-insulator transition in a model of a doped semiconductor that treats disorder and interactions on an equal footing. The model is analyzed using density functional theory. From a multi-fractal analysis of the Kohn-Sham eigenfunctions, we find for the critical exponent of the correlation length. This differs from that of Anderson's model of localization and suggests that the Coulomb interaction changes the universality class of the transition.
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