Texture of ZnO thin films deposited through microwave irradiation

TL;DR

This study investigates the crystallographic texture of ZnO thin films with nanorods grown via microwave irradiation on various substrates, revealing substrate-dependent texture orientations using X-ray analysis.

Contribution

It introduces a microwave irradiation assisted method for growing ZnO nanorod films and analyzes how different substrates influence their crystallographic texture.

Findings

ZnO films on Si and Ge show mixed texture.

On other substrates, ZnO films exhibit c-axis orientation.

Microwave-assisted growth affects film texture based on substrate type.

Abstract

We report the crystallographic texture of ZnO thin films comprising nanorods grown by a microwave irradiation assisted method. Different substrates were used, namely Si, Ge, metal coated Si, PMMA coated Si and ITO coated glass, to examine the respective development of crystallographic texture. The films were characterized by Xray diffraction and scanning electron microscopy, while the texture analysis was done by Xray pole figure analysis using the Schultz reflection method. The ZnO film deposited on Si and Ge showed a mixed texture. On all the other substrates, c axis oriented ZnO films were obtained.