Surface optical phonon scattering in N-polar GaN quantum well channels
Uttam Singisetti

TL;DR
This paper presents theoretical calculations of surface optical phonon scattering in N-polar GaN quantum wells, highlighting its impact on electron mobility, especially in ultra-thin channels with high-k dielectrics.
Contribution
It provides the first detailed analysis of SO phonon scattering effects on 2-DEG mobility in N-polar GaN channels with various dielectrics.
Findings
SO phonon scattering has minimal impact for channels thicker than 5 nm.
In 3 nm channels, SO scattering significantly reduces mobility.
High SO phonon energy dielectric (SiNx) results in negligible scattering.
Abstract
N-polar GaN channel mobility is important for high frequency device applications. In this Letter, we report the theoretical calculations on the surface optical (SO) phonon scattering rate of two-dimensional electron gas (2-DEG) in N-polar GaN quantum well channels with high-k dielectrics. The effect of SO phonons on 2-DEG mobility was found to be small at >5 nm channel thickness. However, the SO mobility in 3 nm N-polar GaN channels with high-k dielectrics is low and limits the total mobility. The SO scattering for SiNx dielectric GaN was found to be negligible due to its high SO phonon energy.
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Acoustic Wave Resonator Technologies · Thermal properties of materials
