Measurement of the Wrong-Sign Decay D0 -> K+ pi- pi+ pi-

Belle Collaboration: E. White; A. J. Schwartz; I. Adachi; H. Aihara,; D. M. Asner; V. Aulchenko; T. Aushev; A. M. Bakich; A. Bala; V. Bhardwaj; B.; Bhuyan; G. Bonvicini; A. Bozek; M. Bra\v{c}ko; J. Brodzicka; T. E. Browder,; V. Chekelian; A. Chen; P. Chen; B. G. Cheon; K. Chilikin; R. Chistov; I.-S.; Cho; K. Cho; V. Chobanova; Y. Choi; D. Cinabro; J. Dingfelder; Z.; Dole\v{z}al; Z. Dr\'asal; D. Dutta; S. Eidelman; D. Epifanov; S. Esen; H.; Farhat; J. E. Fast; M. Feindt; T. Ferber; A. Frey; V. Gaur; N. Gabyshev; S.; Ganguly; R. Gillard; Y. M. Goh; B. Golob; T. Hara; K. Hayasaka; H. Hayashii,; Y. Hoshi; W.-S. Hou; Y. B. Hsiung; H. J. Hyun; T. Iijima; A. Ishikawa; R.; Itoh; Y. Iwasaki; T. Iwashita; I. Jaegle; T. Julius; D. H. Kah; J. H. Kang,; E. Kato; C. Kiesling; D. Y. Kim; H. O. Kim; J. B. Kim; J. H. Kim; M. J. Kim,; Y. J. Kim; K. Kinoshita; J. Klucar; B. R. Ko; P. Kody\v{s}; S. Korpar; P.; Kri\v{z}an; P. Krokovny; B. Kronenbitter; T. Kuhr; T. Kumita; A. Kuzmin,; Y.-J. Kwon; J. S. Lange; S.-H. Lee; J. Li; Y. Li; L. Li Gioi; J. Libby; C.; Liu; Y. Liu; D. Liventsev; P. Lukin; D. Matvienko; H. Miyata; R. Mizuk; G. B.; Mohanty; A. Moll; R. Mussa; E. Nakano; M. Nakao; Z. Natkaniec; M. Nayak; E.; Nedelkovska; C. Ng; N. K. Nisar; S. Nishida; O. Nitoh; S. Ogawa; S. Okuno; C.; Oswald; P. Pakhlov; G. Pakhlova; H. Park; H. K. Park; R. Pestotnik; M.; Petri\v{c}; L. E. Piilonen; M. Ritter; M. R\"ohrken; A. Rostomyan; S. Ryu; H.; Sahoo; T. Saito; Y. Sakai; S. Sandilya; L. Santelj; T. Sanuki; Y. Sato; V.; Savinov; O. Schneider; G. Schnell; C. Schwanda; D. Semmler; K. Senyo; O.; Seon; M. E. Sevior; M. Shapkin; T.-A. Shibata; J.-G. Shiu; B. Shwartz; A.; Sibidanov; Y.-S. Sohn; A. Sokolov; E. Solovieva; S. Stani\v{c}; M.; Stari\v{c}; M. Steder; T. Sumiyoshi; U. Tamponi; G. Tatishvili; Y. Teramoto,; M. Uchida; S. Uehara; Y. Unno; S. Uno; S. E. Vahsen; C. Van Hulse; G. Varner,; V. Vorobyev; M. N. Wagner; C. H. Wang; M.-Z. Wang; P. Wang; Y. Watanabe; K.; M. Williams; E. Won; Y. Yamashita; S. Yashchenko; Y. Yusa; Z. P. Zhang; V.; Zhilich; V. Zhulanov; A. Zupanc

arXiv:1307.5935·hep-ex·October 30, 2013

Measurement of the Wrong-Sign Decay D0 -> K+ pi- pi+ pi-

Belle Collaboration: E. White, A. J. Schwartz, I. Adachi, H. Aihara,, D. M. Asner, V. Aulchenko, T. Aushev, A. M. Bakich, A. Bala, V. Bhardwaj, B., Bhuyan, G. Bonvicini, A. Bozek, M. Bra\v{c}ko, J. Brodzicka, T. E. Browder,, V. Chekelian, A. Chen, P. Chen, B. G. Cheon

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TL;DR

This paper measures the rate of the rare wrong-sign decay D0 -> K+ pi- pi+ pi- relative to the right-sign decay, using a large dataset from the Belle detector, providing a precise branching fraction ratio.

Contribution

The study provides the first precise measurement of the wrong-sign decay D0 -> K+ pi- pi+ pi- branching fraction ratio using 791 fb-1 of data from Belle.

Findings

01

Branching fraction ratio R_WS = 0.324% ± 0.008% (stat) ± 0.007% (sys)

02

Branching fraction B(D0 -> K+ pi- pi+ pi-) = (2.61 ± 0.06 +0.09 -0.08) x 10^-4

03

Large dataset enables precise measurement of rare decay

Abstract

A measurement of the rate for the "wrong-sign" decay D0 -> K+ pi- pi+ pi- relative to that for the "right-sign" decay D0 -> K- pi+ pi+ pi- is presented. Using 791 fb-1 of data collected with the Belle detector, we obtain a branching fraction ratio of R_WS = [0.324 +- 0.008 (stat) +- 0.007 (sys)]%. Multiplying this ratio by the world average value for the branching fraction B(D0 -> K- pi+ pi+ pi-) gives a branching fraction B(D0 -> K+ pi- pi+ pi-) = (2.61 +- 0.06 +0.09 -0.08) x 10-4.

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