Transient stimulated emission from multi-split-gated graphene structure
A. Satou, F. T. Vasko, T. Otsuji, and V. V. Mitin

TL;DR
This paper proposes a mechanism for transient stimulated emission in multi-split-gated graphene structures, demonstrating potential for mid-infrared lasing with specific conditions and analyzing effects like waveguide losses and temperature.
Contribution
It introduces a new mechanism for transient population inversion in graphene with multi-split gates and analyzes conditions for lasing in the mid-IR spectral region.
Findings
Stimulated emission occurs after lateral carrier spreading due to drift-diffusion.
Lasing conditions with gain above 100 cm$^{-1}$ are achievable in specific graphene structures.
Waveguide losses and temperature effects influence the lasing performance.
Abstract
Mechanism of transient population inversion in graphene with multi-splitted (interdigitated) top-gate and grounded back gate is suggested and examined for the mid-infrared (mid-IR) spectral region. Efficient stimulated emission after fast lateral spreading of carriers due to drift-diffusion processes is found for the case of a slow electron-hole recombination in the passive region. We show that with the large gate-to-graphene distance the drift process always precedes the diffusion process, due to the ineffective screening of the inplane electric field by the gates. Conditions for lasing with a gain above 100 cm are found for cases of single- and multi-layer graphene placed in the waveguide formed by the top and back gates. Both the waveguide losses and temperature effects are analyzed.
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