Single event effect characterization of the mixed-signal ASIC developed for CCD camera in space use

TL;DR

This paper evaluates the single event effect tolerance of a mixed-signal ASIC for space-based CCD cameras, demonstrating low latch-up and upset rates suitable for space missions through proton and heavy ion testing.

Contribution

It provides the first detailed SEE characterization of a space-grade mixed-signal ASIC using proton and heavy ion beams, estimating event rates in low-earth orbit.

Findings

SEL rate below once per 49 years

SEU rate upper limit of 1.3x10^{-3} events/sec

SEU events are negligible compared to background noise

Abstract

We present the single event effect (SEE) tolerance of a mixed-signal application-specific integrated circuit (ASIC) developed for a charge-coupled device camera onboard a future X-ray astronomical mission. We adopted proton and heavy ion beams at HIMAC/NIRS in Japan. The particles with high linear energy transfer (LET) of 57.9 MeV cm^{2}/mg is used to measure the single event latch-up (SEL) tolerance, which results in a sufficiently low cross-section of sigma_{SEL} < 4.2x10^{-11} cm^{2}/(IonxASIC). The single event upset (SEU) tolerance is estimated with various kinds of species with wide range of energy. Taking into account that a part of the protons creates recoiled heavy ions that has higher LET than that of the incident protons, we derived the probability of SEU event as a function of LET. Then the SEE event rate in a low-earth orbit is estimated considering a simulation result of LET spectrum. SEL rate is below once per 49 years, which satisfies the required latch-up tolerance. The upper limit of the SEU rate is derived to be 1.3x10^{-3}events/sec. Although the SEU events cannot be distinguished from the signals of X-ray photons from astronomical objects, the derived SEU rate is below 1.3% of expected non-X-ray background rate of the detector and hence these events should not be a major component of the instrumental background.