Signatures of the Berry curvature in the frequency dependent interlayer magnetoresistance in tilted magnetic fields

TL;DR

This paper demonstrates how Berry curvature influences the frequency-dependent interlayer magnetoresistance in layered metals, revealing signatures in periodic orbit resonances and proposing a method to measure Berry curvature at the Fermi surface.

Contribution

It introduces a novel approach to detect and quantify Berry curvature effects through finite frequency interlayer magnetoresistance measurements in tilted magnetic fields.

Findings

Berry curvature affects periodic orbit resonances.

Zero-frequency magnetoresistance extrema are Berry curvature independent.

Method to extract Berry curvature magnitude from experimental data.

Abstract

We show that in a layered metal, the angle dependent, finite frequency, interlayer magnetoresistance is altered due to the presence of a non-zero Berry curvature at the Fermi surface. At zero frequency, we find a conservation law which demands that the `magic angle' condition for interlayer magnetoresistance extrema as a function of magnetic field tilt angle is essentially both field and Berry curvature independent. In the finite frequency case, however, we find that surprisingly large signatures of a finite Berry curvature occur in the periodic orbit resonances. We outline a method whereby the presence and magnitude of the Berry curvature at the Fermi surface can be extracted.