Two-dimensional metal-insulator-transition as a potential fluctuation driven semiclassical transport phenomenon
S. Das Sarma, E. H. Hwang, Qiuzi Li

TL;DR
This paper presents a classical percolation model explaining the 2D metal-insulator transition in semiconductor heterostructures as a fluctuation-driven phenomenon caused by long-range Coulomb disorder, matching experimental observations.
Contribution
It introduces a semiclassical, percolation-based framework for understanding the 2D MIT, emphasizing the role of potential fluctuations and inhomogeneous carrier localization.
Findings
Qualitative agreement with experimental 2D MIT behavior
Identification of a crossover in temperature dependence of resistivity
Demonstration of the role of long-range disorder in transport phenomena
Abstract
We theoretically consider the carrier density tuned (apparent) two-dimensional (2D) metal-insulator-transition (MIT) in semiconductor heterostructure-based 2D carrier systems as arising from a classical percolation phenomenon in the inhomogeneous density landscape created by the long-range potential fluctuations induced by random quenched charged impurities in the environment. The long-range Coulomb disorder inherent in semiconductors produces strong potential fluctuations in the 2D system where a fraction of the carriers gets trapped or classically localized, leading to a mixed 2-component semiclassical transport behavior at intermediate densities where a fraction of the carriers is mobile and another fraction immobile. At high carrier density, all the carriers are essentially mobile whereas at low carrier density all the carriers are essentially trapped since there is no possible…
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