Efficient experimental estimation of fidelity of linear optical quantum Toffoli gate

TL;DR

This paper introduces an efficient method to estimate the fidelity of N-qubit controlled-Z gates using fewer measurements, demonstrated on a three-qubit linear optical Toffoli gate with high fidelity.

Contribution

The authors develop a lower bound for quantum process fidelity based on output state fidelities, reducing measurement complexity compared to full tomography.

Findings

Fidelity of the Toffoli gate estimated as F >= 0.83

Method requires fewer measurements than full process tomography

Successfully demonstrated entangling capability with GHZ states

Abstract

We propose an efficiently measurable lower bound on quantum process fidelity of N-qubit controlled-Z gates. This bound is determined by average output state fidelities for N partially conjugate product bases. A distinct advantage of our approach is that only fidelities with product states need to be measured while keeping the total number of measurements much smaller than what is necessary for full quantum process tomography. As an application, we use this method to experimentally estimate quantum process fidelity F of a three-qubit linear optical quantum Toffoli gate and we find that F>=0.83. We also demonstrate the entangling capability of the gate by preparing GHZ-type three-qubit entangled states from input product states.