Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals
G. Beutier (SIMAP), M. Verdier (SIMAP), M. De Boissieu (SIMAP), B., Gilles (SIMAP), F. Livet (SIMAP), M.-I. Richard (IM2NP, ESRF), T. W., Cornelius (IM2NP, ESRF), S. Labat (IM2NP), O. Thomas (IM2NP)

TL;DR
This study combines coherent x-ray micro-diffraction with local mechanical loading to observe plastic deformation in copper nanocrystals, revealing defect formation through diffraction pattern analysis.
Contribution
It introduces a novel experimental approach integrating x-ray diffraction and mechanical loading to study deformation at the nanoscale.
Findings
Sharp diffraction features indicate defect formation.
Global diffraction shape remains conserved during deformation.
Method enables real-time defect observation in nanocrystals.
Abstract
Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron size obtained by loading the sample with an Atomic Force Microscopy tip. The appearance of sharp features in the diffraction pattern, while conserving its global shape, is attributed to crystal defects induced by the tip.
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