Beam test of a one-dimensional position sensitive chamber on synchrotron radiation
Liu Mei, Dai Hong-Liang, Qi Hui-Rong, Zhuang Bao-An, Zhang Jian, Liu, Rong-Guang, Zhu Qi-Ming, Ouyang Qun, Chen Yuan-Bo, Jiang Xiao-Shan, Wang, Ya-Jie, Liu Peng, Chang Guang-Cai

TL;DR
This paper reports on the development and testing of a one-dimensional position-sensitive chamber for high-resolution powder diffraction using synchrotron radiation, demonstrating good accuracy and potential for improved diffraction measurements.
Contribution
The paper introduces a novel one-dimensional single-wire chamber for synchrotron radiation diffraction, with experimental validation and analysis of its precision and optimal measurement conditions.
Findings
Diffraction angles matched standard data within 1-4.7% error.
Position resolution achieved was 138 micrometers.
Optimal sample-detector distance is 400-600 mm.
Abstract
One-dimensional single-wire chamber was developed to provide high position resolution for powder diffraction experiments with synchrotron radiation. A diffraction test using the sample of SiO2 has been accomplished at 1W2B laboratory of Beijing Synchrotron Radiation Source. The data of beam test were analyzed and some diffraction angles were obtained. The experimental results were in good agreement with standard data from ICDD powder diffraction file. The precision of diffraction angles was 1% to 4.7%. Most of relative errors between measured values of diffraction angles and existing data were less than 1%. As for the detector, the best position resolution in the test was 138 um (sigma value) with an X-ray tube. Finally, discussions of the results were given. The major factor that affected the precision of measurement was deviation from the flat structure of detector. The effect was…
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Taxonomy
TopicsX-ray Diffraction in Crystallography
