Origin of the two-dimensional electron gas at LaAlO3/SrTiO3 interfaces: The role of oxygen vacancies and electronic reconstruction
Z. Q. Liu, C. J. Li, W. M. L\"u, X. H. Huang, Z. Huang, S. W. Zeng,, X.P.Qiu, L. S. Huang, A. Annadi, J. S. Chen, J. M. D. Coey, T. Venkatesan,, and Ariando

TL;DR
This study investigates the origins of conductivity at LaAlO3/SrTiO3 interfaces, demonstrating that oxygen vacancies dominate in amorphous overlayers, while both oxygen vacancies and polarization effects contribute in crystalline overlayers, with crystallinity being crucial.
Contribution
It provides a comprehensive comparison showing the distinct roles of oxygen vacancies and polarization catastrophe in different LaAlO3/SrTiO3 interface configurations.
Findings
Oxygen vacancies are the main source of carriers in amorphous overlayers.
Both oxygen vacancies and polarization contribute in crystalline, unannealed heterostructures.
Polarization catastrophe alone explains conductivity in oxygen-annealed crystalline interfaces.
Abstract
The relative importance of atomic defects and electron transfer in explaining conductivity at the crystalline LaAlO3/SrTiO3 interface has been a topic of debate. Metallic interfaces with similar electronic properties produced by amorphous oxide overlayers on SrTiO3 have called in question the original polarization catastrophe model. We resolve the issue by a comprehensive comparison of (100)-oriented SrTiO3 substrates with crystalline and amorphous overlayers of LaAlO3 of different thicknesses prepared under different oxygen pressures. For both types of overlayers, there is a critical thickness for the appearance of conductivity, but its value is always 4 unit cells (around 1.6 nm) for the oxygen-annealed crystalline case, whereas in the amorphous case, the critical thickness could be varied in the range 0.5 to 6 nm according to the deposition conditions. Subsequent ion milling of the…
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