Complete spatial characterization of an optical wavefront using a variable-separation pinhole pair

TL;DR

This paper introduces a novel method for detailed spatial characterization of optical wavefronts by analyzing interference patterns from a variable-separation pinhole pair, enabling simultaneous measurement of intensity, phase, and coherence.

Contribution

The paper presents a new technique combining a scanning X-shaped slit and a static slit to recover wavefront intensity, phase, and coherence from interference data.

Findings

Successfully characterized high harmonic radiation in a gas cell

Method can be extended to various light sources

Provides comprehensive spatial wavefront information

Abstract

We present a technique for measuring the transverse spatial properties of an optical wavefront. Intensity and phase profiles are recovered by analysis of a series of interference patterns produced by the combination of a scanning X-shaped slit and a static horizontal slit; the spatial coherence may be found from the same data. We demonstrate the technique by characterizing high harmonic radiation generated in a gas cell, however the method could be extended to a wide variety of light sources.