Depletion layer-induced size effects in ferroelectric thin films: A Ginzburg-Landau model study

TL;DR

This study uses a Ginzburg-Landau model to show how depletion layers influence the size-dependent ferroelectric properties in thin films, highlighting the role of free charge and internal electric fields.

Contribution

It introduces a theoretical framework demonstrating the impact of depletion layers and free charge on ferroelectric thin film properties, including domain formation and polarization.

Findings

Depletion layers induce internal electric fields in ferroelectric thin films.

High donor dopant density and small thicknesses lead to domain pattern formation.

Free charge significantly affects remnant polarization in thin ferroelectric films.

Abstract

A Ginzburg-Landau model is used to demonstrate how depletion layers give rise to thickness-dependent ferroelectric properties in thin films. It is shown that free charge layers at the film-electrode interface can result in an internal electric field in the bulk of the film even when no external voltage is applied. At high values of the donor dopant density and small thicknesses, this internal electric field can be strong enough to lead to the formation of a domain pattern. This causes a drop in the remnant polarization; a direct demonstration of the important role free charge plays in thin ferroelectric films.