Modulation Coding for Flash Memories

TL;DR

This paper addresses data reliability issues in scaled flash memories by categorizing vulnerable data patterns and proposing modulation coding schemes to transform these into more robust patterns, enhancing overall reliability.

Contribution

It introduces a new categorization of data patterns based on degradation mechanisms and pattern dependency, along with modulation coding schemes to improve flash memory reliability.

Findings

Pattern-dependent degradation mechanisms identified

Proposed modulation coding schemes effectively transform vulnerable patterns

Improved data reliability in flash memories

Abstract

The aggressive scaling down of flash memories has threatened data reliability since the scaling down of cell sizes gives rise to more serious degradation mechanisms such as cell-to-cell interference and lateral charge spreading. The effect of these mechanisms has pattern dependency and some data patterns are more vulnerable than other ones. In this paper, we will categorize data patterns taking into account degradation mechanisms and pattern dependency. In addition, we propose several modulation coding schemes to improve the data reliability by transforming original vulnerable data patterns into more robust ones.